Publication:
Photoelectrical properties of InP-InGaAsp heterojunction avalanche photodiodes

dc.contributor.authorKadirov, O.
dc.contributor.buuauthorAhmetoğlu, Muhitdin
dc.contributor.buuauthorÖzer, Mehmet
dc.contributor.departmentFen Edebiyat Fakültesi
dc.contributor.departmentFizik Bölümü
dc.contributor.scopusid16021109400
dc.contributor.scopusid9742545600
dc.date.accessioned2022-03-08T08:25:44Z
dc.date.available2022-03-08T08:25:44Z
dc.date.issued2009-06
dc.description.abstractPhotoelectrical properties and the spectrum of the avalanche multiplication factor versus the reverse voltage at room temperature have been studied for LPE grown for InP-In(x)Ga(1-x)AsyP(1-y) heterostructures. The tunneling current becomes substantial at peak junction electric fields as low as 10(5) V/m due to the small direct energy gaps and small effective masses of the structures tested. The process of breakdown in the investigated structures was of the avalanche type. The results found for the lowering of the tunneling current in the pre-breakdown region. The temperature coefficient of the breakdown voltage beta = (1/V-B).(dV(B)/dT) > 0 was determined in the temperature range 77-300 K and its value was found to be beta = 5.78 x 10(-4) K-1.
dc.identifier.citationAhmetoğlu, M. vd. (2009). "Photoelectrical properties of InP-InGaAsp heterojunction avalanche photodiodes". Optoelectronics and Advanced Materials, Rapid Communications, 3(6), 608-611.
dc.identifier.endpage611
dc.identifier.issn1842-6573
dc.identifier.issue6
dc.identifier.scopus2-s2.0-77951983589
dc.identifier.startpage608
dc.identifier.urihttp://hdl.handle.net/11452/24900
dc.identifier.volume3
dc.identifier.wos000268723400019
dc.indexed.wosSCIE
dc.language.isoen
dc.publisherNatl Inst Optoelectronics
dc.relation.collaborationYurt dışı
dc.relation.journalOptoelectronics and Advanced Materials, Rapid Communications
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectHeterostructures
dc.subjectPhotoelectrical properties
dc.subjectThe tunneling current
dc.subjectPhoto-diodes
dc.subjectPhotodetector
dc.subjectMaterials science
dc.subjectOptics
dc.subjectElectric fields
dc.subjectElectron tunneling
dc.subjectHeterojunctions
dc.subjectIII-V semiconductors
dc.subjectIndium phosphide
dc.subjectSemiconducting indium phosphide
dc.subjectAvalanche multiplication factor
dc.subjectDirect energy gaps
dc.subjectEffective mass
dc.subjectPhoto-electrical properties
dc.subjectReverse voltages
dc.subjectTemperature coefficient
dc.subjectTemperature range
dc.subjectTunneling current
dc.subjectTemperature
dc.subject.scopusLiquid Phase Epitaxy; Photoconductive Cells; Light Emitting Diodes
dc.subject.wosMaterials science, multidisciplinary
dc.subject.wosOptics
dc.titlePhotoelectrical properties of InP-InGaAsp heterojunction avalanche photodiodes
dc.typeArticle
dc.wos.quartileQ4
dspace.entity.typePublication
local.contributor.departmentFen Edebiyat Fakültesi/Fizik Bölümü
local.indexed.atScopus
local.indexed.atWOS

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